Agilent Technologies has launched a parametric test solution for laboratory and R&D environments that provides ultra short pulsed IV measurements as as narrow as 10 nano seconds.This capability makes possible extremely accurate testing of thermally or charge sensitive devices,such as silicon(SOI) and high K dielectric transistors used in high speed logic applications.
The ultra short pulsed IV solution includes the B1500A semiconductor device analyzer , a pulse generator,a digital oscilloscope,new application software and pulsed IV accessories.Its key benefits include 1uA current resolution for correlation between DC and pulse measurements,support for switching between standard DC characterization and pulsed IV characterization without having to change cables and a flexible configuration that allows customers to use existing equipment,making initial cost of entry low.
